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Rafael E. Rivadeneira, Patricia L. Suarez, Angel D. Sappa, & Boris X. Vintimilla. (2019). Thermal Image SuperResolution through Deep Convolutional Neural Network. In 16th International Conference on Image Analysis and Recognition (ICIAR 2019); Waterloo, Canadá (pp. 417–426).
Abstract: Due to the lack of thermal image datasets, a new dataset has been acquired for proposed a superesolution approach using a Deep Convolution Neural Network schema. In order to achieve this image enhancement process a new thermal images dataset is used. Di?erent experiments have been carried out, ?rstly, the proposed architecture has been trained using only images of the visible spectrum, and later it has been trained with images of the thermal spectrum, the results showed that with the network trained with thermal images, better results are obtained in the process of enhancing the images, maintaining the image details and perspective. The thermal dataset is available at http://www.cidis.espol.edu.ec/es/dataset
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Patricia L. Suarez, Angel D. Sappa, & Boris X. Vintimilla. (2019). Image patch similarity through a meta-learning metric based approach. In 15th International Conference on Signal Image Technology & Internet based Systems (SITIS 2019); Sorrento, Italia (pp. 511–517).
Abstract: Comparing images regions are one of the core methods used on computer vision for tasks like image classification, scene understanding, object detection and recognition. Hence, this paper proposes a novel approach to determine similarity of image regions (patches), in order to obtain the best representation of image patches. This problem has been studied by many researchers presenting different approaches, however, the ability to find the better criteria to measure the similarity on image regions are still a challenge. The present work tackles this problem using a few-shot metric based meta-learning framework able to compare image regions and determining a similarity measure to decide if there is similarity between the compared patches. Our model is training end-to-end from scratch. Experimental results
have shown that the proposed approach effectively estimates the similarity of the patches and, comparing it with the state of the art approaches, shows better results.
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Omar Coello, M. C., Darío Carpio, Boris X. Vintimilla & Luis Chuquimarca. (2024). Enhancing Apple’s Defect Classification: Insights from Visible Spectrum and Narrow Spectral Band Imaging. In Accepted in 14th International Conference on Pattern Recognition Systems (ICPRS).
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Luis Chuquimarca, B. X. V. & S. V. (2024). Classifying Healthy and Defective Fruits with a Siamese Architecture and CNN Models. In Accepted in 14th International Conference on Pattern Recognition Systems (ICPRS).
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