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Patricia Súarez, Henry Velesaca, Dario Carpio & Angel Sappa Corn Kernel Classification From Few Training Samples 2023 In journal Artificial Intelligence in Agriculture Vol. 9 pp. 89-99 details   doi
Patricia Suarez, Angel Sappa Depth-Conditioned Thermal-like Image Generation 2024 Accepted in 14th International Conference on Pattern Recognition Systems (ICPRS) details   openurl
Patricia Suarez, Angel D. Sappa A Generative Model for Guided Thermal Image Super-Resolution 2024 In 19th International Conference on Computer Vision Theory and Applications VISAPP 2024 details   openurl
Patricia Suarez & Angel Sappa Toward a thermal image-like representation 2023 Proceedings of the International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications VISIGRAPP 2023 133 - 140 details   pdf openurl
Patricia Suarez & Angel D. Sappa Haze-Free Imaging through Haze-Aware Transformer Adaptations 2024 In Fourth International Conference on Innovations in Computational Intelligence and Computer Vision (ICICV 2024) details   openurl
Patricia L. Suarez, Dario Carpio, Angel Sappa Boosting Guided Super-Resolution Performance with Synthesized Images 2023 17th International Conference On Signal Image Technology & Internet Based Systems details   openurl
Patricia L. Suarez, Dario Carpio, Angel Sappa Depth Map Estimation from a Single 2D Image 2023 17th International Conference On Signal Image Technology & Internet Based Systems details   openurl
Patricia L. Suarez, Dario Carpio, Angel D. Sappa and Henry O. Velesaca Transformer based Image Dehazing. 2022 16TH International Conference On Signal Image Technology & Internet Based Systems SITIS 2022. 148-154 details   url
Pabelco Zambrano, Fernanda Calderon, Héctor Villegas, Jonathan Paillacho, Doménica Pazmiño, Miguel Realpe UAV Remote Sensing applications and current trends in crop monitoring and diagnostics: A Systematic Literature Review 2023 IEEE 13th International Conference on Pattern Recognition Systems (ICPRS) 2023, julio 4-7 details   pdf isbn
Omar Coello, Moisés Coronel, Darío Carpio, Boris X. Vintimilla & Luis Chuquimarca Enhancing Apple’s Defect Classification: Insights from Visible Spectrum and Narrow Spectral Band Imaging 2024 Accepted in 14th International Conference on Pattern Recognition Systems (ICPRS) details   openurl
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