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Author |
Ortiz J.; Londono J.; Novillo F.; Ampuno A.; Chávez M. |
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Title |
Determinación de Invariantes en Grandes Centros de Datos basados en Topología Fat-Tree |
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Journal Article |
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Year |
2015 |
Publication |
Revista Politécnica |
Abbreviated Journal |
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Vol. 35 |
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pp. 91-96 |
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Keywords |
Invariantes de red, topologías, Fat-tree, simulación, emulación |
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Abstract |
Durante los últimos años ha existido un fuerte incremento en el acceso a internet, causando que los centros de datos ( DC) deban adaptar dinámicamente su infraestructura de red de cara a enfrentar posibles problemas de congestión, la cual no siempre se da de forma oportuna. Ante esto, nuevas topologías de red se han propuesto en los últimos años, como una forma de brindar mejores condiciones para el manejo de tráfico interno, sin embargo es común que para el estudio de estas mejoras, se necesite recrear el comportamiento de un verdadero DC en modelos de simulación/emulación. Por lo tanto se vuelve esencial validar dichos modelos, de cara a obtener resultados coherentes con la realidad. Esta validación es posible por medio de la identificación de ciertas propiedades que se deducen a partir de las variables y los parámetros que describen la red, y que se mantienen en las topologías de los DC para diversos escenarios y/o configuraciones. Estas propiedades, conocidas como invariantes, son una expresión del funcionamiento de la red en ambientes reales, como por ejemplo la ruta más larga entre dos nodos o el número de enlaces mínimo que deben fallar antes de una pérdida de conectividad en alguno de los nodos de la red. En el presente trabajo se realiza la identificación, formulación y comprobación de dos invariantes para la topología Fat-Tree, utilizando como software emulador a mininet. Las conclusiones muestran resultados concordantes entre lo analítico y lo práctico. |
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Escuela Politécnica Nacional |
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Español |
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Español |
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cidis @ cidis @ |
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32 |
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Author |
Angel D. Sappa; Juan A. Carvajal; Cristhian A. Aguilera; Miguel Oliveira; Dennis G. Romero; Boris X. Vintimilla |
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Title |
Wavelet-Based Visible and Infrared Image Fusion: A Comparative Study |
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Journal Article |
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Year |
2016 |
Publication |
Sensors Journal |
Abbreviated Journal |
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Vol. 16 |
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Pages |
pp. 1-15 |
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Keywords |
image fusion; fusion evaluation metrics; visible and infrared imaging; discrete wavelet transform |
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This paper evaluates different wavelet-based cross-spectral image fusion strategies adopted to merge visible and infrared images. The objective is to find the best setup independently of the evaluation metric used to measure the performance. Quantitative performance results are obtained with state of the art approaches together with adaptations proposed in the current work. The options evaluated in the current work result from the combination of different setups in the wavelet image decomposition stage together with different fusion strategies for the final merging stage that generates the resulting representation. Most of the approaches evaluate results according to the application for which they are intended for. Sometimes a human observer is selected to judge the quality of the obtained results. In the current work, quantitative values are considered in order to find correlations between setups and performance of obtained results; these correlations can be used to define a criteria for selecting the best fusion strategy for a given pair of cross-spectral images. The whole procedure is evaluated with a large set of correctly registered visible and infrared image pairs, including both Near InfraRed (NIR) and LongWave InfraRed (LWIR). |
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cidis @ cidis @ |
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47 |
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Author |
Ricaurte P; Chilán C; Cristhian A. Aguilera; Boris X. Vintimilla; Angel D. Sappa |
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Title |
Feature Point Descriptors: Infrared and Visible Spectra |
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Journal Article |
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2014 |
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Sensors Journal |
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Vol. 14 |
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pp. 3690-3701 |
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cross-spectral imaging; feature point descriptors |
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This manuscript evaluates the behavior of classical feature point descriptors when they are used in images from long-wave infrared spectral band and compare them with the results obtained in the visible spectrum. Robustness to changes in rotation, scaling, blur, and additive noise are analyzed using a state of the art framework. Experimental results using a cross-spectral outdoor image data set are presented and conclusions from these experiments are given. |
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cidis @ cidis @ |
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28 |
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Author |
Cristhian A. Aguilera; Cristhian Aguilera; Angel D. Sappa |
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Title |
Melamine faced panels defect classification beyond the visible spectrum. |
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Journal Article |
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Year |
2018 |
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In Sensors 2018 |
Abbreviated Journal |
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Vol. 11 |
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Issue 11 |
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In this work, we explore the use of images from different spectral bands to classify defects in melamine faced panels, which could appear through the production process. Through experimental evaluation, we evaluate the use of images from the visible (VS), near-infrared (NIR), and long wavelength infrared (LWIR), to classify the defects using a feature descriptor learning approach together with a support vector machine classifier. Two descriptors were evaluated, Extended Local Binary Patterns (E-LBP) and SURF using a Bag of Words (BoW) representation. The evaluation was carried on with an image set obtained during this work, which contained five different defect categories that currently occurs in the industry. Results show that using images from beyond
the visual spectrum helps to improve classification performance in contrast with a single visible spectrum solution. |
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gtsi @ user @ |
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89 |
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