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| Author | Title | Year | Publication | Volume | Pages |
|---|---|---|---|---|---|
| Omar Coello, Moisés Coronel, Darío Carpio, Boris X. Vintimilla & Luis Chuquimarca | Enhancing Apple’s Defect Classification: Insights from Visible Spectrum and Narrow Spectral Band Imaging | 2024 | 14th International Conference on Pattern Recognition Systems (ICPRS) |