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Author |
Title |
Year |
Publication |
Volume |
Pages |
Links  |
|
|
Henry O. Velesaca and Juan A. Holgado-Terriza |
OPC-UA in artificial intelligence: a systematic review of the integration of data mining and NLP in industrial processes |
2025 |
Manufacturing Review |
Vol. 12 |
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|
|
|
Jácome Galarza, Luis; Realpe, Miguel; Viñán-Ludeña, Marlon Santiago; Calderón, María Fernanda; Jaramillo, Silvia |
AgriTransformer: A Transformer-Based Model with Attention Mechanisms for Enhanced Multimodal Crop Yield Prediction |
2025 |
Electronics |
Vol. 14 |
|
|
|
|
Ramos, Leo Thomas & Sappa, Angel D. |
A comprehensive analysis of YOLO architectures for tomato leaf disease identification |
2025 |
Scientific Reports |
Vol. 15 |
|
|
|
|
Luis E. Chuquimarca, Boris X. Vintimilla & Sergio A. Velastin |
Assessing deep learning model robustness for banana ripeness classification under varying illumination conditions |
2025 |
Smart Agricultural Technology |
Vol. 12 |
|
|
|
|
Armin Mehri, Parichehr Behjati, Dario Carpio, and Angel D. Sappa |
Edge Craft Odyssey: Navigating Guided Super-Resolution with a Fast, Precise, and Lightweight Network |
2026 |
Pattern Recognition |
Vol.172, Part A |
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|
|
|
Henry O. Velesaca, Juan A. Holgado-Terriza and Jose M. Gutierrez-Guerrero |
Industrial Process Automation Through Machine Learning and OPC-UA: A Systematic Literature Review |
2025 |
Electronics |
Vol. 14 |
|
|
|
|
Leo Thomas Ramos & Angel D. Sappa |
A Decade of You Only Look Once (YOLO) for Object Detection: A Review |
2025 |
IEEE Access journal |
13 |
192747 - 192794 |
|
|
|
Leo Ramos & Angel D. Sappa |
A Decade of You Only Look Once (YOLO) for Object Detection: A Review |
|
A Decade of You Only Look Once (YOLO) for Object Detection: A Review |
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