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Author (up) Cristhian A. Aguilera, Cristhian Aguilera, Cristóbal A. Navarro, & Angel D. Sappa pdf  openurl
  Title Fast CNN Stereo Depth Estimation through Embedded GPU Devices Type Journal Article
  Year 2020 Publication Sensors 2020 Abbreviated Journal  
  Volume Vol. 2020-June Issue 11 Pages pp. 1-13  
  Keywords stereo matching; deep learning; embedded GPU  
  Abstract Current CNN-based stereo depth estimation models can barely run under real-time

constraints on embedded graphic processing unit (GPU) devices. Moreover, state-of-the-art

evaluations usually do not consider model optimization techniques, being that it is unknown what is

the current potential on embedded GPU devices. In this work, we evaluate two state-of-the-art models

on three different embedded GPU devices, with and without optimization methods, presenting

performance results that illustrate the actual capabilities of embedded GPU devices for stereo depth

estimation. More importantly, based on our evaluation, we propose the use of a U-Net like architecture

for postprocessing the cost-volume, instead of a typical sequence of 3D convolutions, drastically

augmenting the runtime speed of current models. In our experiments, we achieve real-time inference

speed, in the range of 5–32 ms, for 1216  368 input stereo images on the Jetson TX2, Jetson Xavier,

and Jetson Nano embedded devices.
 
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language English Summary Language English Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 14248220 ISBN Medium  
  Area Expedition Conference  
  Notes Approved no  
  Call Number cidis @ cidis @ Serial 132  
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Author (up) Cristhian A. Aguilera; Cristhian Aguilera; Angel D. Sappa pdf  openurl
  Title Melamine faced panels defect classification beyond the visible spectrum. Type Journal Article
  Year 2018 Publication In Sensors 2018 Abbreviated Journal  
  Volume Vol. 11 Issue Issue 11 Pages  
  Keywords  
  Abstract In this work, we explore the use of images from different spectral bands to classify defects in melamine faced panels, which could appear through the production process. Through experimental evaluation, we evaluate the use of images from the visible (VS), near-infrared (NIR), and long wavelength infrared (LWIR), to classify the defects using a feature descriptor learning approach together with a support vector machine classifier. Two descriptors were evaluated, Extended Local Binary Patterns (E-LBP) and SURF using a Bag of Words (BoW) representation. The evaluation was carried on with an image set obtained during this work, which contained five different defect categories that currently occurs in the industry. Results show that using images from beyond

the visual spectrum helps to improve classification performance in contrast with a single visible spectrum solution.
 
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Medium  
  Area Expedition Conference  
  Notes Approved no  
  Call Number gtsi @ user @ Serial 89  
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