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| Author | Cristhian A. Aguilera, Cristhian Aguilera, Cristóbal A. Navarro, & Angel D. Sappa | ||||
| Title | Fast CNN Stereo Depth Estimation through Embedded GPU Devices | Type | Journal Article | ||
| Year | 2020 | Publication | Sensors 2020 | Abbreviated Journal | |
| Volume | Vol. 2020-June | Issue  |
11 | Pages | pp. 1-13 |
| Keywords | stereo matching; deep learning; embedded GPU | ||||
| Abstract | Current CNN-based stereo depth estimation models can barely run under real-time constraints on embedded graphic processing unit (GPU) devices. Moreover, state-of-the-art evaluations usually do not consider model optimization techniques, being that it is unknown what is the current potential on embedded GPU devices. In this work, we evaluate two state-of-the-art models on three different embedded GPU devices, with and without optimization methods, presenting performance results that illustrate the actual capabilities of embedded GPU devices for stereo depth estimation. More importantly, based on our evaluation, we propose the use of a U-Net like architecture for postprocessing the cost-volume, instead of a typical sequence of 3D convolutions, drastically augmenting the runtime speed of current models. In our experiments, we achieve real-time inference speed, in the range of 5–32 ms, for 1216 368 input stereo images on the Jetson TX2, Jetson Xavier, and Jetson Nano embedded devices. |
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | English | Summary Language | English | Original Title | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 14248220 | ISBN | Medium | ||
| Area | Expedition | Conference | |||
| Notes | Approved | no | |||
| Call Number | cidis @ cidis @ | Serial | 132 | ||
| Permanent link to this record | |||||
| Author | Cristhian A. Aguilera; Cristhian Aguilera; Angel D. Sappa | ||||
| Title | Melamine faced panels defect classification beyond the visible spectrum. | Type | Journal Article | ||
| Year | 2018 | Publication | In Sensors 2018 | Abbreviated Journal | |
| Volume | Vol. 11 | Issue |
Issue 11 | Pages | |
| Keywords | |||||
| Abstract | In this work, we explore the use of images from different spectral bands to classify defects in melamine faced panels, which could appear through the production process. Through experimental evaluation, we evaluate the use of images from the visible (VS), near-infrared (NIR), and long wavelength infrared (LWIR), to classify the defects using a feature descriptor learning approach together with a support vector machine classifier. Two descriptors were evaluated, Extended Local Binary Patterns (E-LBP) and SURF using a Bag of Words (BoW) representation. The evaluation was carried on with an image set obtained during this work, which contained five different defect categories that currently occurs in the industry. Results show that using images from beyond the visual spectrum helps to improve classification performance in contrast with a single visible spectrum solution. |
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| Language | Summary Language | Original Title | |||
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| Area | Expedition | Conference | |||
| Notes | Approved | no | |||
| Call Number | gtsi @ user @ | Serial | 89 | ||
| Permanent link to this record | |||||