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Omar Coello, Moisés Coronel, Darío Carpio, Boris X. Vintimilla & Luis Chuquimarca |
Enhancing Apple’s Defect Classification: Insights from Visible Spectrum and Narrow Spectral Band Imaging |
2024 |
14th International Conference on Pattern Recognition Systems (ICPRS) Londres 15 – 18 July 2024 |
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