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Author Title Year Publication (down) Volume Pages
Henry Velesaca Lara, Patricia Suarez, Darío Carpio & Angel Sappa Fruit Grading based on Deep Learning and Active Vision System 2024 Accepted in CIIA – II International Conference of Applied Industrial Engineering
Henry Velesaca Lara, Juan Antonio Holgado & José Miguel Gutiérrez Optimizing Smart Factory Operations: A Methodological Approach to Industrial System Implementation based on OPC-UA 2024 Accepted in CIIA – II International Conference of Applied Industrial Engineering
Rafael E. Rivadeneira, Angel D. Sappa, Chenyang Wang, Junjun Jiang, Zhiwei Zhong, Peilin Chen & Shiqi Wang Thermal Image Super Resolution Challenge Results – PBVS 2024 2024 Accepted in 20th IEEE Workshop on Perception Beyond the Visible Spectrum of the 2024 Conference on Computer Vision and Pattern Recognition
Angel D. Sappa, Spencer Low, Oliver Nina, Erik Blasch, Dylan Bowald & Nathan Inkawhich Multi-modal Aerial View Image Challenge: SAR Classification 2024 Accepted in 20th IEEE Workshop on Perception Beyond the Visible Spectrum of the 2024 Conference on Computer Vision and Pattern Recognition
Angel D. Sappa, Spencer Low, Oliver Nina, Erik Blasch, Dylan Bowald & Nathan Inkawhich Multi-modal Aerial View Image Challenge: Sensor Domain Translation 2024 Accepted in 20th IEEE Workshop on Perception Beyond the Visible Spectrum of the 2024 Conference on Computer Vision and Pattern Recognition
Patricia Suarez, Angel Sappa Depth-Conditioned Thermal-like Image Generation 2024 Accepted in 14th International Conference on Pattern Recognition Systems (ICPRS)
Omar Coello, Moisés Coronel, Darío Carpio, Boris X. Vintimilla & Luis Chuquimarca Enhancing Apple’s Defect Classification: Insights from Visible Spectrum and Narrow Spectral Band Imaging 2024 Accepted in 14th International Conference on Pattern Recognition Systems (ICPRS)
Luis Chuquimarca, Boris X. Vintimilla & Sergio Velastin Classifying Healthy and Defective Fruits with a Siamese Architecture and CNN Models 2024 Accepted in 14th International Conference on Pattern Recognition Systems (ICPRS)
Henry O. Velesaca, Juan Antonio Holgado-Terriza, José Miguel Gutiérrez Guerrero, Tonny Toscano, Darío Carpio & Angel Sappa Anomaly Detection in Industrial Production Products using OPC-UA and Deep Learning 2024 Accepted in 13th International Conference on Data Science, Technology and Applications (DATA).
Benítez-Quintero J., Quevedo-Pinos O., Calderon, Fernanda Notes on Sulfur Fluxes in Urban Areas with Industrial Activity 2022 20th LACCEI International Multi-Conference for Engineering, Education Caribbean Conference for Engineering and Technology, LACCEI 2022, 2022-July